Blog

5 Advantages of FPGA-Based Customization for Test & Measurement

How instruments with user-programmable FPGAs are replacing racks of test equipment, and what that means for your lab.

May 22, 2026

Faster, more powerful real-time customization with MokuOS 4.2

MokuOS 4.2 unlocks higher bandwidth, faster real-time processing, and more instruments on Moku:Delta, all with a simple software update.

March 19, 2026

Neural Networks on GPUs vs. CPUs vs. FPGAs

Why real-time inference belongs on an FPGA

December 11, 2025

MokuOS 4.1 adds high-speed data streaming for Moku:Delta and more flexibility than ever before

Learn about the Gigabit Streamer, time correlation measurements, and extra customization options for Moku devices.

December 3, 2025

Implementing automated test equipment (ATE) in electronics test

Automated Test Equipment replaces manual testing with integrated, software-driven systems that deliver speed, precision, and scalability for modern electronics manufacturing.

November 3, 2025

Understanding 1/f noise (flicker noise)

1/f, or flicker noise, is a key characteristic of semiconductor devices. Learn how to measure and mitigate this phenomenon.

August 25, 2025

Introducing MokuOS 4.0: The latest unified operating system for Moku hardware

Learn about the improved UI, 8-channel Multi-Instrument Mode, and a variety of extra instrument features

August 25, 2025

Quantum sensing with atomic systems and reconfigurable instrumentation: Q&A recap

Learn more about how to measure input sensitivity, implement active feedback, and understand event timing resolution

July 24, 2025

Introducing Moku:Delta, the most flexible 2 GHz test platform with over two billion instrument configurations

Learn how Moku:Delta delivers best-in-class instrument performance and endless possibilities

June 25, 2025