Applications

Semiconductor device validation

Perform end-to-end, mixed-signal test with a full suite of instruments, including the highest-resolution 2 GHz Oscilloscope.

Adaptable to any environment

In semiconductor design validation and manufacturing environments, test throughput and flexibility are critical. The faster you can verify performance across a population of devices, the faster your new product can get to market. With Moku devices, you can test up to eight devices in parallel with eight source channels, eight measure channels, and 32 channels of DIO. Plus, you can build multi-instrument test configurations programmatically to further parallelize DUT verification.

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Learn about protocol decoding

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Using Moku:Pro for photonic IC control system research at Intel Labs

“Instead of the hundreds of steps needed to converge when using a multidimensional sweep, Moku:Pro helped us accomplish this in just a few iterations.”

Learn how the team at Intel has achieved significant time savings and reduced complexity in their measurements of silicon photonic chips.

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Engineer at desk conducting component testing with Moku:Pro

Semiconductor test resources

Explore user case studies, comprehensive application notes, and detailed configuration guides on semiconductor testing.

Dual-frequency resonance tracking (DFRT)

Learn how to implement Dual Frequency Resonance Tracking on Moku:Pro

Amplitude spectral density under different input ranges

Understanding noise floor and bandwidth in precision instruments

Analyze quantization noise and noise bandwidth with the Moku Lock-in Amplifier and Oscilloscope

Moku:Lab and Moku:Pro setup with a lock-in amplifier interface on the iPad to conduct quadrant photodiode sensing (QPD).

Improving SNR measurement with a boxcar averager

Implement boxcar averaging for enhanced data quality and SNR with Moku Cloud Compile, and learn how to get started fast with Moku:Pro

Power spectral density measurement on the Moku Phasemeter to conduct oscillator characterization

What is power spectral density (PSD), and why is it important?

Learn more about the applications, calculation methods, and practical uses of this critical measurement

MEMS characterization 101: Everything you need to know

These small devices are already a big part of technology. But how do we perform MEMS characterization?

Reducing noise and transients with custom real-time digital filtering

Implement custom moving average filters to optimize signal processing and effectively reduce noise and transients in your applications

FAQ

Is Moku suitable for mixed-signal IC testing?

Absolutely. Moku provides instruments such as the Spectrum Analyzer, Arbitrary Waveform Generator, and Frequency Response Analyzer, which are ideal for characterizing DUT behavior and verifying analog-to-digital performance. By pairing these instruments alongside the Oscilloscope and Logic Analyzer in Multi-Instrument Mode, you can fully characterize mixed-signal ICs.

What if I’m testing wafers, not packaged ICs?

Moku devices contain over 15 different instruments, meaning you can adapt them to a broad set of applications. With the Lock-in Amplifier, you can perform key semiconductor wafer characterization tests such as wafer flatness, thin film thickness measurements, and more.

I need a custom instrument. Can I access the FPGA inside Moku?

Yes. Moku is the only professional-grade test and measurement device to provide a full suite of instruments capable of running alongside user-designed algorithms. To deploy custom instrumentation, use Moku Cloud Compile.

Is Moku suitable for performing flicker noise and noise spectral density tests?

Absolutely. The Moku Spectrum Analyzer is one of the only spectrum analyzers available that can measure down to 0 Hz. This functionality — in addition to the low noise floor, < 1 Hz resolution bandwidth, and the ability to measure on eight channels simultaneously — means you have a powerful tool for these types of noise tests.

Can Moku perform open loop gain and gain bandwidth product tests on op amps?

Yes. The Moku Frequency Response Analyzer provides a single instrument solution for tests like open loop gain and gain bandwidth product. With its high channel count, it can run multiple Frequency Response Analyzers in parallel, giving you the ability to test several op amps simultaneously.

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